الفهرس | Only 14 pages are availabe for public view |
Abstract Tetraphenylporphyrin, TPP, has been investigated by using different techniques, such as: single crystal and powder diffractometers, Fourier transform infrared spectroscopy, optical spectrophotometer, and two probe techniques. The XRD showed that, TPP in powder form is polycrystalline. The composed diffraction card for TPP was performed by using both of inteplanar spacing obtained from XRD and the unit cell parameters calculated from single crystal measurements. The optical properties of TPP in as deposited conditions and annealed thin films were investigated using the spectrophotometric measurements of transmittance, T, reflectance, R, and absorbance, A, at normal incidence in the wavelength range 200<U+2013>2200 nm. The electrical transport properties of TPP thin films were studied by using the two point probe technique. The electrical (DC and AC) resistivity, conductivity and dielectric properties dependence on temperature (297 <U+2013> 473 K) and frequency (0.1 <U+2013> 100 KHz) have been measured. Au / TPP / ntype Si / Al heterojunction solar cell was constructed and prepared by growing TPP film (67 nm) on nSi wafer using thermal evaporation technique. |